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Automatic XAFS measurement system developed at BL14B2 in SPring-8
A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical comp...
Autores principales: | Oji, Hiroshi, Taniguchi, Yosuke, Hirayama, Sayaka, Ofuchi, Hironori, Takagaki, Masashi, Honma, Tetsuo |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3621170/ https://www.ncbi.nlm.nih.gov/pubmed/22186644 http://dx.doi.org/10.1107/S0909049511042518 |
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