Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling

Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ∼10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficul...

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Detalles Bibliográficos
Autores principales: Mayer, Marcel, Keskinbora, Kahraman, Grévent, Corinne, Szeghalmi, Adriana, Knez, Mato, Weigand, Markus, Snigirev, Anatoly, Snigireva, Irina, Schütz, Gisela
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3628450/
https://www.ncbi.nlm.nih.gov/pubmed/23592622
http://dx.doi.org/10.1107/S0909049513006602

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3628450/
https://www.ncbi.nlm.nih.gov/pubmed/23592622
http://dx.doi.org/10.1107/S0909049513006602

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