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Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling
Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ∼10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficul...
Autores principales: | Mayer, Marcel, Keskinbora, Kahraman, Grévent, Corinne, Szeghalmi, Adriana, Knez, Mato, Weigand, Markus, Snigirev, Anatoly, Snigireva, Irina, Schütz, Gisela |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3628450/ https://www.ncbi.nlm.nih.gov/pubmed/23592622 http://dx.doi.org/10.1107/S0909049513006602 |
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