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A new route to the Mott-Hubbard metal-insulator transition: Strong correlations effects in Pr(0.7)Ca(0.3)MnO(3)

Resistive random access memory based on the resistive switching phenomenon is emerging as a strong candidate for next generation non-volatile memory. So far, the resistive switching effect has been observed in many transition metal oxides, including strongly correlated ones, such as, cuprate superco...

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Detalles Bibliográficos
Autores principales: Lee, Hong Sub, Choi, Sun Gyu, Park, Hyung-Ho, Rozenberg, M. J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3632877/
http://dx.doi.org/10.1038/srep01704