Influence of embedding Cu nano-particles into a Cu/SiO(2)/Pt structure on its resistive switching

Cu nano-particles (Cu-NPs) were embedded into the SiO(2) layer of a Cu/SiO(2)/Pt structure to examine their influence on resistive switching characteristics. The device showed a reversible resistive switching behavior, which was due to the formation and rupture of a Cu-conducting filament with an el...

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Detalles Bibliográficos
Autores principales: Liu, Chih-Yi, Huang, Jyun-Jie, Lai, Chun-Hung, Lin, Chao-Han
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3637068/
https://www.ncbi.nlm.nih.gov/pubmed/23566527
http://dx.doi.org/10.1186/1556-276X-8-156

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3637068/
https://www.ncbi.nlm.nih.gov/pubmed/23566527
http://dx.doi.org/10.1186/1556-276X-8-156

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