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Influence of embedding Cu nano-particles into a Cu/SiO(2)/Pt structure on its resistive switching
Cu nano-particles (Cu-NPs) were embedded into the SiO(2) layer of a Cu/SiO(2)/Pt structure to examine their influence on resistive switching characteristics. The device showed a reversible resistive switching behavior, which was due to the formation and rupture of a Cu-conducting filament with an el...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3637068/ https://www.ncbi.nlm.nih.gov/pubmed/23566527 http://dx.doi.org/10.1186/1556-276X-8-156 |