Low-frequency flicker noise in a MSM device made with single Si nanowire (diameter ≈ 50 nm)

Low-frequency flicker noise has been measured in a metal-semiconductor-metal (MSM) device made from a single strand of a single crystalline Si nanowire (diameter approximately 50 nm). Measurement was done with an alternating current (ac) excitation for the noise measurement superimposed with direct...

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Detalles Bibliográficos
Autores principales: Samanta, Sudeshna, Das, Kaustuv, Raychaudhuri, Arup Kumar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3648426/
https://www.ncbi.nlm.nih.gov/pubmed/23574820
http://dx.doi.org/10.1186/1556-276X-8-165

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3648426/
https://www.ncbi.nlm.nih.gov/pubmed/23574820
http://dx.doi.org/10.1186/1556-276X-8-165

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