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Low-frequency flicker noise in a MSM device made with single Si nanowire (diameter ≈ 50 nm)
Low-frequency flicker noise has been measured in a metal-semiconductor-metal (MSM) device made from a single strand of a single crystalline Si nanowire (diameter approximately 50 nm). Measurement was done with an alternating current (ac) excitation for the noise measurement superimposed with direct...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3648426/ https://www.ncbi.nlm.nih.gov/pubmed/23574820 http://dx.doi.org/10.1186/1556-276X-8-165 |