A Novel Two-Axis Load Sensor Designed for in Situ Scratch Testing inside Scanning Electron Microscopes

Because of a lack of available miniaturized multiaxial load sensors to measure the normal load and the lateral load simultaneously, quantitative in situ scratch devices inside scanning electron microscopes and the transmission electron microscopes have barely been developed up to now. A novel two-ax...

Descripción completa

Detalles Bibliográficos
Autores principales: Huang, Hu, Zhao, Hongwei, Wu, Boda, Wan, Shunguang, Shi, Chengli
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3649380/
https://www.ncbi.nlm.nih.gov/pubmed/23429516
http://dx.doi.org/10.3390/s130202552

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3649380/
https://www.ncbi.nlm.nih.gov/pubmed/23429516
http://dx.doi.org/10.3390/s130202552

Ejemplares similares