Cargando…
Fluorescent microscopy beyond diffraction limits using speckle illumination and joint support recovery
Structured illumination microscopy (SIM) breaks the optical diffraction limit by illuminating a sample with a series of line-patterned light. Recently, in order to alleviate the requirement of precise knowledge of illumination patterns, structured illumination microscopy techniques using speckle pat...
Autores principales: | , , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2013
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3691569/ https://www.ncbi.nlm.nih.gov/pubmed/23797902 http://dx.doi.org/10.1038/srep02075 |