Fluorescent microscopy beyond diffraction limits using speckle illumination and joint support recovery

Structured illumination microscopy (SIM) breaks the optical diffraction limit by illuminating a sample with a series of line-patterned light. Recently, in order to alleviate the requirement of precise knowledge of illumination patterns, structured illumination microscopy techniques using speckle pat...

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Detalles Bibliográficos
Autores principales: Min, Junhong, Jang, Jaeduck, Keum, Dongmin, Ryu, Seung-Wook, Choi, Chulhee, Jeong, Ki-Hun, Ye, Jong Chul
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3691569/
https://www.ncbi.nlm.nih.gov/pubmed/23797902
http://dx.doi.org/10.1038/srep02075

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