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Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes
One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3701429/ https://www.ncbi.nlm.nih.gov/pubmed/23844344 http://dx.doi.org/10.3762/bjnano.4.45 |