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Non-volatile memory based on the ferroelectric photovoltaic effect

The quest for a solid state universal memory with high-storage density, high read/write speed, random access and non-volatility has triggered intense research into new materials and novel device architectures. Though the non-volatile memory market is dominated by flash memory now, it has very low op...

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Detalles Bibliográficos
Autores principales: Guo, Rui, You, Lu, Zhou, Yang, Shiuh Lim, Zhi, Zou, Xi, Chen, Lang, Ramesh, R., Wang, Junling
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Pub. Group 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3709492/
https://www.ncbi.nlm.nih.gov/pubmed/23756366
http://dx.doi.org/10.1038/ncomms2990
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author Guo, Rui
You, Lu
Zhou, Yang
Shiuh Lim, Zhi
Zou, Xi
Chen, Lang
Ramesh, R.
Wang, Junling
author_facet Guo, Rui
You, Lu
Zhou, Yang
Shiuh Lim, Zhi
Zou, Xi
Chen, Lang
Ramesh, R.
Wang, Junling
author_sort Guo, Rui
collection PubMed
description The quest for a solid state universal memory with high-storage density, high read/write speed, random access and non-volatility has triggered intense research into new materials and novel device architectures. Though the non-volatile memory market is dominated by flash memory now, it has very low operation speed with ~10 μs programming and ~10 ms erasing time. Furthermore, it can only withstand ~10(5) rewriting cycles, which prevents it from becoming the universal memory. Here we demonstrate that the significant photovoltaic effect of a ferroelectric material, such as BiFeO(3) with a band gap in the visible range, can be used to sense the polarization direction non-destructively in a ferroelectric memory. A prototype 16-cell memory based on the cross-bar architecture has been prepared and tested, demonstrating the feasibility of this technique.
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spelling pubmed-37094922013-07-15 Non-volatile memory based on the ferroelectric photovoltaic effect Guo, Rui You, Lu Zhou, Yang Shiuh Lim, Zhi Zou, Xi Chen, Lang Ramesh, R. Wang, Junling Nat Commun Article The quest for a solid state universal memory with high-storage density, high read/write speed, random access and non-volatility has triggered intense research into new materials and novel device architectures. Though the non-volatile memory market is dominated by flash memory now, it has very low operation speed with ~10 μs programming and ~10 ms erasing time. Furthermore, it can only withstand ~10(5) rewriting cycles, which prevents it from becoming the universal memory. Here we demonstrate that the significant photovoltaic effect of a ferroelectric material, such as BiFeO(3) with a band gap in the visible range, can be used to sense the polarization direction non-destructively in a ferroelectric memory. A prototype 16-cell memory based on the cross-bar architecture has been prepared and tested, demonstrating the feasibility of this technique. Nature Pub. Group 2013-06-11 /pmc/articles/PMC3709492/ /pubmed/23756366 http://dx.doi.org/10.1038/ncomms2990 Text en Copyright © 2013, Nature Publishing Group, a division of Macmillan Publishers Limited. All Rights Reserved. http://creativecommons.org/licenses/by-nc-sa/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-sa/3.0/
spellingShingle Article
Guo, Rui
You, Lu
Zhou, Yang
Shiuh Lim, Zhi
Zou, Xi
Chen, Lang
Ramesh, R.
Wang, Junling
Non-volatile memory based on the ferroelectric photovoltaic effect
title Non-volatile memory based on the ferroelectric photovoltaic effect
title_full Non-volatile memory based on the ferroelectric photovoltaic effect
title_fullStr Non-volatile memory based on the ferroelectric photovoltaic effect
title_full_unstemmed Non-volatile memory based on the ferroelectric photovoltaic effect
title_short Non-volatile memory based on the ferroelectric photovoltaic effect
title_sort non-volatile memory based on the ferroelectric photovoltaic effect
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3709492/
https://www.ncbi.nlm.nih.gov/pubmed/23756366
http://dx.doi.org/10.1038/ncomms2990
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