Finite Element Analysis of Electrically Excited Quartz Tuning Fork Devices

Quartz Tuning Fork (QTF)-based Scanning Probe Microscopy (SPM) is an important field of research. A suitable model for the QTF is important to obtain quantitative measurements with these devices. Analytical models have the limitation of being based on the double cantilever configuration. In this pap...

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Detalles Bibliográficos
Autores principales: Oria, Roger, Otero, Jorge, González, Laura, Botaya, Luis, Carmona, Manuel, Puig-Vidal, Manel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3715236/
https://www.ncbi.nlm.nih.gov/pubmed/23722828
http://dx.doi.org/10.3390/s130607156

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3715236/
https://www.ncbi.nlm.nih.gov/pubmed/23722828
http://dx.doi.org/10.3390/s130607156

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