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Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations c...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778321/ https://www.ncbi.nlm.nih.gov/pubmed/24068841 http://dx.doi.org/10.1107/S0021889813019067 |