X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 µm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress stat...

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Detalles Bibliográficos
Autores principales: Stefenelli, Mario, Todt, Juraj, Riedl, Angelika, Ecker, Werner, Müller, Thomas, Daniel, Rostislav, Burghammer, Manfred, Keckes, Jozef
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778322/
https://www.ncbi.nlm.nih.gov/pubmed/24068842
http://dx.doi.org/10.1107/S0021889813019535

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778322/
https://www.ncbi.nlm.nih.gov/pubmed/24068842
http://dx.doi.org/10.1107/S0021889813019535

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