Disorder strongly enhances Auger recombination in conductive quantum-dot solids

Auger recombination (AR) can be an important loss mechanism for optoelectronic devices, but it is typically not very efficient at low excitation densities. Here we show that in conductive quantum-dot solids, AR is the dominant charge carrier decay path even at excitation densities as low as 10(−3) p...

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Detalles Bibliográficos
Autores principales: Gao, Yunan, Sandeep, C. S. Suchand, Schins, Juleon M., Houtepen, Arjan J., Siebbeles, Laurens D. A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Pub. Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778520/
https://www.ncbi.nlm.nih.gov/pubmed/24029819
http://dx.doi.org/10.1038/ncomms3329

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778520/
https://www.ncbi.nlm.nih.gov/pubmed/24029819
http://dx.doi.org/10.1038/ncomms3329

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