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Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy

Spin-polarized currents represent an efficient tool for manipulating ferromagnetic nanostructures but the critical current density necessary for the magnetization switching is usually too high for applications. Here we show theoretically that, in magnetic tunnel junctions having electric-field-depen...

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Autor principal: Pertsev, Nikolay A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3782881/
https://www.ncbi.nlm.nih.gov/pubmed/24067783
http://dx.doi.org/10.1038/srep02757
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author Pertsev, Nikolay A.
author_facet Pertsev, Nikolay A.
author_sort Pertsev, Nikolay A.
collection PubMed
description Spin-polarized currents represent an efficient tool for manipulating ferromagnetic nanostructures but the critical current density necessary for the magnetization switching is usually too high for applications. Here we show theoretically that, in magnetic tunnel junctions having electric-field-dependent interfacial anisotropy, the critical density may reduce down to a very low level (~10(4) A cm(−2)) when the junction combines small conductance with the proximity of free layer to a size-driven spin reorientation transition. The theory explains easy magnetization switching recently discovered in CoFeB/MgO/CoFeB tunnel junctions, surprisingly showing that it happens when the spin-transfer torque is relatively small, and provides a recipe for the fabrication of magnetic tunnel junctions suitable for industrial memory applications.
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spelling pubmed-37828812013-09-25 Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy Pertsev, Nikolay A. Sci Rep Article Spin-polarized currents represent an efficient tool for manipulating ferromagnetic nanostructures but the critical current density necessary for the magnetization switching is usually too high for applications. Here we show theoretically that, in magnetic tunnel junctions having electric-field-dependent interfacial anisotropy, the critical density may reduce down to a very low level (~10(4) A cm(−2)) when the junction combines small conductance with the proximity of free layer to a size-driven spin reorientation transition. The theory explains easy magnetization switching recently discovered in CoFeB/MgO/CoFeB tunnel junctions, surprisingly showing that it happens when the spin-transfer torque is relatively small, and provides a recipe for the fabrication of magnetic tunnel junctions suitable for industrial memory applications. Nature Publishing Group 2013-09-25 /pmc/articles/PMC3782881/ /pubmed/24067783 http://dx.doi.org/10.1038/srep02757 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/
spellingShingle Article
Pertsev, Nikolay A.
Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title_full Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title_fullStr Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title_full_unstemmed Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title_short Origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
title_sort origin of easy magnetization switching in magnetic tunnel junctions with voltage-controlled interfacial anisotropy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3782881/
https://www.ncbi.nlm.nih.gov/pubmed/24067783
http://dx.doi.org/10.1038/srep02757
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