Potentiometric-scanning ion conductance microscopy for measurement at tight junctions

Scanning Ion Conductance Microscopy (SICM) has been developed originally for high-resolution imaging of topographic features. Recently, we have described a hybrid voltage scanning mode of SICM, termed Potentiometric-SICM (P-SICM) for recording transmembrane ionic conductance at specific nanostructur...

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Detalles Bibliográficos
Autores principales: Zhou, Yi, Chen, Chiao-Chen, Weber, Anna E., Zhou, Lushan, Baker, Lane A., Hou, Jianghui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Landes Bioscience 2013
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3805658/
https://www.ncbi.nlm.nih.gov/pubmed/24533255
http://dx.doi.org/10.4161/tisb.25585

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3805658/
https://www.ncbi.nlm.nih.gov/pubmed/24533255
http://dx.doi.org/10.4161/tisb.25585

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