A Phenomenological Model for the Photocurrent Transient Relaxation Observed in ZnO-Based Photodetector Devices

We present a phenomenological model for the photocurrent transient relaxation observed in ZnO-based metal-semiconductor-metal (MSM) planar photodetector devices based on time-resolved surface band bending. Surface band bending decreases during illumination, due to migration of photogenerated holes t...

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Detalles Bibliográficos
Autores principales: Moore, James C., Thompson, Cody V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3812587/
https://www.ncbi.nlm.nih.gov/pubmed/23921826
http://dx.doi.org/10.3390/s130809921

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3812587/
https://www.ncbi.nlm.nih.gov/pubmed/23921826
http://dx.doi.org/10.3390/s130809921

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