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A Phenomenological Model for the Photocurrent Transient Relaxation Observed in ZnO-Based Photodetector Devices
We present a phenomenological model for the photocurrent transient relaxation observed in ZnO-based metal-semiconductor-metal (MSM) planar photodetector devices based on time-resolved surface band bending. Surface band bending decreases during illumination, due to migration of photogenerated holes t...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3812587/ https://www.ncbi.nlm.nih.gov/pubmed/23921826 http://dx.doi.org/10.3390/s130809921 |