Currents Induced by Injected Charge in Junction Detectors

The problem of drifting charge-induced currents is considered in order to predict the pulsed operational characteristics in photo- and particle-detectors with a junction controlled active area. The direct analysis of the field changes induced by drifting charge in the abrupt junction devices with a...

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Detalles Bibliográficos
Autores principales: Gaubas, Eugenijus, Ceponis, Tomas, Kalesinskas, Vidas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3821295/
https://www.ncbi.nlm.nih.gov/pubmed/24036586
http://dx.doi.org/10.3390/s130912295

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3821295/
https://www.ncbi.nlm.nih.gov/pubmed/24036586
http://dx.doi.org/10.3390/s130912295

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