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Measuring long-range carrier diffusion across multiple grains in polycrystalline semiconductors by photoluminescence imaging
Thin-film polycrystalline semiconductors are currently at the forefront of inexpensive large-area solar cell and integrated circuit technologies because of their reduced processing and substrate selection constraints. Understanding the extent to which structural and electronic defects influence carr...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Pub. Group
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3826654/ https://www.ncbi.nlm.nih.gov/pubmed/24158163 http://dx.doi.org/10.1038/ncomms3699 |