Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup

This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also dis...

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Detalles Bibliográficos
Autores principales: Cheng, Hui-Wen, Chang, Yuan-Chih, Tang, Song-Nien, Yuan, Chi-Tsu, Tang, Jau, Tseng, Fan-Gang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3835868/
https://www.ncbi.nlm.nih.gov/pubmed/24237663
http://dx.doi.org/10.1186/1556-276X-8-482

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3835868/
https://www.ncbi.nlm.nih.gov/pubmed/24237663
http://dx.doi.org/10.1186/1556-276X-8-482

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