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Focused ion beam processing to fabricate ohmic contact electrodes on a bismuth nanowire for Hall measurements
Ohmic contact electrodes for four-wire resistance and Hall measurements were fabricated on an individual single-crystal bismuth nanowire encapsulated in a cylindrical quartz template. Focused ion beam processing was utilized to expose the side surfaces of the bismuth nanowire in the template, and ca...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2013
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849392/ https://www.ncbi.nlm.nih.gov/pubmed/24070421 http://dx.doi.org/10.1186/1556-276X-8-400 |