Tip-Enhanced Raman Imaging and Nano Spectroscopy of Etched Silicon Nanowires

Tip-enhanced Raman spectroscopy (TERS) is used to investigate the influence of strains in isolated and overlapping silicon nanowires prepared by chemical etching of a (100) silicon wafer. An atomic force microscopy tip made of nanocrystalline diamond coated with a thin layer of silver is used in con...

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Detalles Bibliográficos
Autores principales: Kazemi-Zanjani, Nastaran, Kergrene, Erwan, Liu, Lijia, Sham, Tsun-Kong, Lagugné-Labarthet, François
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3859034/
https://www.ncbi.nlm.nih.gov/pubmed/24072021
http://dx.doi.org/10.3390/s131012744

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3859034/
https://www.ncbi.nlm.nih.gov/pubmed/24072021
http://dx.doi.org/10.3390/s131012744

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