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Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications

We investigated SiC-based hydrogen gas sensors with metal-insulator-semiconductor (MIS) structure for high temperature process monitoring and leak detection applications in fields such as the automotive, chemical and petroleum industries. In this work, a thin tantalum oxide (Ta(2)O(5)) layer was exp...

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Detalles Bibliográficos
Autores principales: Kim, Seongjeen, Choi, Jehoon, Jung, Minsoo, Joo, Sungjae, Kim, Sangchoel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3859079/
https://www.ncbi.nlm.nih.gov/pubmed/24113685
http://dx.doi.org/10.3390/s131013575
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author Kim, Seongjeen
Choi, Jehoon
Jung, Minsoo
Joo, Sungjae
Kim, Sangchoel
author_facet Kim, Seongjeen
Choi, Jehoon
Jung, Minsoo
Joo, Sungjae
Kim, Sangchoel
author_sort Kim, Seongjeen
collection PubMed
description We investigated SiC-based hydrogen gas sensors with metal-insulator-semiconductor (MIS) structure for high temperature process monitoring and leak detection applications in fields such as the automotive, chemical and petroleum industries. In this work, a thin tantalum oxide (Ta(2)O(5)) layer was exploited with the purpose of sensitivity improvement, because tantalum oxide has good stability at high temperature with high permeability for hydrogen gas. Silicon carbide (SiC) was used as a substrate for high-temperature applications. We fabricated Pd/Ta(2)O(5)/SiC-based hydrogen gas sensors, and the dependence of their I-V characteristics and capacitance response properties on hydrogen concentrations were analyzed in the temperature range from room temperature to 500 °C. According to the results, our sensor shows promising performance for hydrogen gas detection at high temperatures.
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spelling pubmed-38590792013-12-11 Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications Kim, Seongjeen Choi, Jehoon Jung, Minsoo Joo, Sungjae Kim, Sangchoel Sensors (Basel) Article We investigated SiC-based hydrogen gas sensors with metal-insulator-semiconductor (MIS) structure for high temperature process monitoring and leak detection applications in fields such as the automotive, chemical and petroleum industries. In this work, a thin tantalum oxide (Ta(2)O(5)) layer was exploited with the purpose of sensitivity improvement, because tantalum oxide has good stability at high temperature with high permeability for hydrogen gas. Silicon carbide (SiC) was used as a substrate for high-temperature applications. We fabricated Pd/Ta(2)O(5)/SiC-based hydrogen gas sensors, and the dependence of their I-V characteristics and capacitance response properties on hydrogen concentrations were analyzed in the temperature range from room temperature to 500 °C. According to the results, our sensor shows promising performance for hydrogen gas detection at high temperatures. Molecular Diversity Preservation International (MDPI) 2013-10-09 /pmc/articles/PMC3859079/ /pubmed/24113685 http://dx.doi.org/10.3390/s131013575 Text en © 2013 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Kim, Seongjeen
Choi, Jehoon
Jung, Minsoo
Joo, Sungjae
Kim, Sangchoel
Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title_full Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title_fullStr Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title_full_unstemmed Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title_short Silicon Carbide-Based Hydrogen Gas Sensors for High-Temperature Applications
title_sort silicon carbide-based hydrogen gas sensors for high-temperature applications
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3859079/
https://www.ncbi.nlm.nih.gov/pubmed/24113685
http://dx.doi.org/10.3390/s131013575
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