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Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here Gaussian Schell-mo...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874016/ https://www.ncbi.nlm.nih.gov/pubmed/24365911 http://dx.doi.org/10.1107/S1600577513023850 |