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Coherence properties of focused X-ray beams at high-brilliance synchrotron sources

An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here Gaussian Schell-mo...

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Detalles Bibliográficos
Autores principales: Singer, Andrej, Vartanyants, Ivan A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874016/
https://www.ncbi.nlm.nih.gov/pubmed/24365911
http://dx.doi.org/10.1107/S1600577513023850
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author Singer, Andrej
Vartanyants, Ivan A.
author_facet Singer, Andrej
Vartanyants, Ivan A.
author_sort Singer, Andrej
collection PubMed
description An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here Gaussian Schell-model beams and thin optical elements are considered. Limiting cases of incoherent and fully coherent illumination of the focusing element are discussed. The effect of the beam-defining aperture, typically used in combination with focusing elements at synchrotron sources to improve transverse coherence, is also analyzed in detail. As an example, the coherence properties in the focal region of compound refractive lenses at the PETRA III synchrotron source are analyzed.
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spelling pubmed-38740162013-12-30 Coherence properties of focused X-ray beams at high-brilliance synchrotron sources Singer, Andrej Vartanyants, Ivan A. J Synchrotron Radiat Research Papers An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here Gaussian Schell-model beams and thin optical elements are considered. Limiting cases of incoherent and fully coherent illumination of the focusing element are discussed. The effect of the beam-defining aperture, typically used in combination with focusing elements at synchrotron sources to improve transverse coherence, is also analyzed in detail. As an example, the coherence properties in the focal region of compound refractive lenses at the PETRA III synchrotron source are analyzed. International Union of Crystallography 2014-01-01 2013-11-02 /pmc/articles/PMC3874016/ /pubmed/24365911 http://dx.doi.org/10.1107/S1600577513023850 Text en © Singer and Vartanyants 2014 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Singer, Andrej
Vartanyants, Ivan A.
Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title_full Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title_fullStr Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title_full_unstemmed Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title_short Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
title_sort coherence properties of focused x-ray beams at high-brilliance synchrotron sources
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874016/
https://www.ncbi.nlm.nih.gov/pubmed/24365911
http://dx.doi.org/10.1107/S1600577513023850
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