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Identification of Leaf Rust Resistance Genes in Selected Egyptian Wheat Cultivars by Molecular Markers
Leaf rust, caused by Puccinia triticina Eriks., is a common and widespread disease of wheat (Triticum aestivum L.) in Egypt. Host resistance is the most economical, effective, and ecologically sustainable method of controlling the disease. Molecular markers help to determine leaf rust resistance gen...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Hindawi Publishing Corporation
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3913395/ https://www.ncbi.nlm.nih.gov/pubmed/24511291 http://dx.doi.org/10.1155/2014/574285 |