An Investigation into Soft Error Detection Efficiency at Operating System Level

Electronic equipment operating in harsh environments such as space is subjected to a range of threats. The most important of these is radiation that gives rise to permanent and transient errors on microelectronic components. The occurrence rate of transient errors is significantly more than permanen...

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Detalles Bibliográficos
Autores principales: Asghari, Seyyed Amir, Kaynak, Okyay, Taheri, Hassan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3916032/
https://www.ncbi.nlm.nih.gov/pubmed/24574894
http://dx.doi.org/10.1155/2014/506105

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3916032/
https://www.ncbi.nlm.nih.gov/pubmed/24574894
http://dx.doi.org/10.1155/2014/506105

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