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Surface Morphology and Sensing Property of NiO-WO(3) Thin Films Prepared by Thermal Evaporation
WO(3) and NiO-WO(3) thin films of various thicknesses were deposited on an Al(2)O(3)-Si (alumina-silicon) substrate using high vacuum thermal evaporation. After annealing at 500°C for 30 minutes in air, the crystallanity and surface morphology of WO(3) and NiO-WO(3) thin films were investigated usin...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Molecular Diversity Preservation International (MDPI)
2005
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3934686/ |