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Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
In the last years there has been a renewed interest for zinc oxide semiconductor, mainly triggered by its prospects in optoelectronic applications. In particular, zinc oxide thin films are being widely used for photovoltaic applications, in which the determination of the electrical conductivity is o...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3935190/ https://www.ncbi.nlm.nih.gov/pubmed/24569599 http://dx.doi.org/10.1038/srep04203 |