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Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy

In the last years there has been a renewed interest for zinc oxide semiconductor, mainly triggered by its prospects in optoelectronic applications. In particular, zinc oxide thin films are being widely used for photovoltaic applications, in which the determination of the electrical conductivity is o...

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Detalles Bibliográficos
Autores principales:	Maragliano, C., Lilliu, S., Dahlem, M. S., Chiesa, M., Souier, T., Stefancich, M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2014
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3935190/ https://www.ncbi.nlm.nih.gov/pubmed/24569599 http://dx.doi.org/10.1038/srep04203

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