Thermal deformation of cryogenically cooled silicon crystals under intense X-ray beams: measurement and finite-element predictions of the surface shape

X-ray crystal monochromators exposed to white-beam X-rays in third-generation synchrotron light sources are subject to thermal deformations that must be minimized using an adequate cooling system. A new approach was used to measure the crystal shape profile and slope of several cryogenically cooled...

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Detalles Bibliográficos
Autores principales: Zhang, Lin, Sánchez del Río, Manuel, Monaco, Giulio, Detlefs, Carsten, Roth, Thomas, Chumakov, Aleksandr I., Glatzel, Pieter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3943555/
https://www.ncbi.nlm.nih.gov/pubmed/23765298
http://dx.doi.org/10.1107/S0909049513009436

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3943555/
https://www.ncbi.nlm.nih.gov/pubmed/23765298
http://dx.doi.org/10.1107/S0909049513009436

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