In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector

Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region w...

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Detalles Bibliográficos
Autores principales: Kachatkou, Anton, Marchal, Julien, van Silfhout, Roelof
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2014
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3945420/
https://www.ncbi.nlm.nih.gov/pubmed/24562554
http://dx.doi.org/10.1107/S1600577513034759

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3945420/
https://www.ncbi.nlm.nih.gov/pubmed/24562554
http://dx.doi.org/10.1107/S1600577513034759

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