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In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector
Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region w...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3945420/ https://www.ncbi.nlm.nih.gov/pubmed/24562554 http://dx.doi.org/10.1107/S1600577513034759 |