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100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications
We report on high frequency (HF) and noise performances of AlSb/InAs high electron mobility transistor (HEMT) with 100 nm gate length at room temperature in low-power regime. Extrinsic cut-off frequencies f (T)/f (max) of 100/125 GHz together with minimum noise figure NF(min) = 0.5 dB and associated...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Hindawi Publishing Corporation
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3953642/ https://www.ncbi.nlm.nih.gov/pubmed/24707193 http://dx.doi.org/10.1155/2014/136340 |
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author | Gardès, Cyrille Bagumako, Sonia Desplanque, Ludovic Wichmann, Nicolas Bollaert, Sylvain Danneville, François Wallart, Xavier Roelens, Yannick |
author_facet | Gardès, Cyrille Bagumako, Sonia Desplanque, Ludovic Wichmann, Nicolas Bollaert, Sylvain Danneville, François Wallart, Xavier Roelens, Yannick |
author_sort | Gardès, Cyrille |
collection | PubMed |
description | We report on high frequency (HF) and noise performances of AlSb/InAs high electron mobility transistor (HEMT) with 100 nm gate length at room temperature in low-power regime. Extrinsic cut-off frequencies f (T)/f (max) of 100/125 GHz together with minimum noise figure NF(min) = 0.5 dB and associated gain G (ass) = 12 dB at 12 GHz have been obtained at drain bias of only 80 mV, corresponding to 4 mW/mm DC power dissipation. This demonstrates the great ability of AlSb/InAs HEMT for high-frequency operation combined with low-noise performances in ultra-low-power regime. |
format | Online Article Text |
id | pubmed-3953642 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | Hindawi Publishing Corporation |
record_format | MEDLINE/PubMed |
spelling | pubmed-39536422014-04-06 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications Gardès, Cyrille Bagumako, Sonia Desplanque, Ludovic Wichmann, Nicolas Bollaert, Sylvain Danneville, François Wallart, Xavier Roelens, Yannick ScientificWorldJournal Research Article We report on high frequency (HF) and noise performances of AlSb/InAs high electron mobility transistor (HEMT) with 100 nm gate length at room temperature in low-power regime. Extrinsic cut-off frequencies f (T)/f (max) of 100/125 GHz together with minimum noise figure NF(min) = 0.5 dB and associated gain G (ass) = 12 dB at 12 GHz have been obtained at drain bias of only 80 mV, corresponding to 4 mW/mm DC power dissipation. This demonstrates the great ability of AlSb/InAs HEMT for high-frequency operation combined with low-noise performances in ultra-low-power regime. Hindawi Publishing Corporation 2014-02-23 /pmc/articles/PMC3953642/ /pubmed/24707193 http://dx.doi.org/10.1155/2014/136340 Text en Copyright © 2014 Cyrille Gardès et al. https://creativecommons.org/licenses/by/3.0/ This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Research Article Gardès, Cyrille Bagumako, Sonia Desplanque, Ludovic Wichmann, Nicolas Bollaert, Sylvain Danneville, François Wallart, Xavier Roelens, Yannick 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title | 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title_full | 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title_fullStr | 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title_full_unstemmed | 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title_short | 100 nm AlSb/InAs HEMT for Ultra-Low-Power Consumption, Low-Noise Applications |
title_sort | 100 nm alsb/inas hemt for ultra-low-power consumption, low-noise applications |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3953642/ https://www.ncbi.nlm.nih.gov/pubmed/24707193 http://dx.doi.org/10.1155/2014/136340 |
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