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p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation

Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A....

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Autores principales: Dervos, Constantine T., Skafidas, Panayotis D., Mergos, John A., Vassiliou, Panayota
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2004
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3954071/
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author Dervos, Constantine T.
Skafidas, Panayotis D.
Mergos, John A.
Vassiliou, Panayota
author_facet Dervos, Constantine T.
Skafidas, Panayotis D.
Mergos, John A.
Vassiliou, Panayota
author_sort Dervos, Constantine T.
collection PubMed
description Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A. Their current-voltage (I-V) response was exploited experimentally both in the dark and under various illumination levels. The quoted values for the saturation current, the ideality factor, the series resistance and the reverse-bias photocurrent are investigated for the simulation of the I-V curves via the quasi-equilibrium model. In addition, the measured I-V data have been further analysed to estimate the produced photocurrent as a function of the applied bias (forward or reverse) under given illumination levels. Comparisons between the simulated curves and the experimental data allowed a detailed photocurrent modelling validation. The proposed approach could be useful towards studying other parameters of optically activated p-n junctions such as: the bias dependence of the minority carrier diffusion lengths and/or the generated rates of electron-hole pairs (EHP).
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spelling pubmed-39540712014-03-14 p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation Dervos, Constantine T. Skafidas, Panayotis D. Mergos, John A. Vassiliou, Panayota Sensors (Basel) Article Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A. Their current-voltage (I-V) response was exploited experimentally both in the dark and under various illumination levels. The quoted values for the saturation current, the ideality factor, the series resistance and the reverse-bias photocurrent are investigated for the simulation of the I-V curves via the quasi-equilibrium model. In addition, the measured I-V data have been further analysed to estimate the produced photocurrent as a function of the applied bias (forward or reverse) under given illumination levels. Comparisons between the simulated curves and the experimental data allowed a detailed photocurrent modelling validation. The proposed approach could be useful towards studying other parameters of optically activated p-n junctions such as: the bias dependence of the minority carrier diffusion lengths and/or the generated rates of electron-hole pairs (EHP). Molecular Diversity Preservation International (MDPI) 2004-07-20 /pmc/articles/PMC3954071/ Text en © 2004 by MDPI (http://www.mdpi.org). Reproduction is permitted for noncommercial purposes.
spellingShingle Article
Dervos, Constantine T.
Skafidas, Panayotis D.
Mergos, John A.
Vassiliou, Panayota
p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title_full p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title_fullStr p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title_full_unstemmed p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title_short p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
title_sort p-n junction photocurrent modelling evaluation under optical and electrical excitation
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3954071/
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