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p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation
Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A....
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2004
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3954071/ |
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author | Dervos, Constantine T. Skafidas, Panayotis D. Mergos, John A. Vassiliou, Panayota |
author_facet | Dervos, Constantine T. Skafidas, Panayotis D. Mergos, John A. Vassiliou, Panayota |
author_sort | Dervos, Constantine T. |
collection | PubMed |
description | Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A. Their current-voltage (I-V) response was exploited experimentally both in the dark and under various illumination levels. The quoted values for the saturation current, the ideality factor, the series resistance and the reverse-bias photocurrent are investigated for the simulation of the I-V curves via the quasi-equilibrium model. In addition, the measured I-V data have been further analysed to estimate the produced photocurrent as a function of the applied bias (forward or reverse) under given illumination levels. Comparisons between the simulated curves and the experimental data allowed a detailed photocurrent modelling validation. The proposed approach could be useful towards studying other parameters of optically activated p-n junctions such as: the bias dependence of the minority carrier diffusion lengths and/or the generated rates of electron-hole pairs (EHP). |
format | Online Article Text |
id | pubmed-3954071 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2004 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-39540712014-03-14 p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation Dervos, Constantine T. Skafidas, Panayotis D. Mergos, John A. Vassiliou, Panayota Sensors (Basel) Article Based upon the quasi-equilibrium approximation, the validity of p-n junction modelling, has been experimentally investigated under synchronous electrical and optical excitation of silicon photo-diodes. The devices had areas of 8.2 mm(2) and reverse bias saturation currents of the order of 10(-10) A. Their current-voltage (I-V) response was exploited experimentally both in the dark and under various illumination levels. The quoted values for the saturation current, the ideality factor, the series resistance and the reverse-bias photocurrent are investigated for the simulation of the I-V curves via the quasi-equilibrium model. In addition, the measured I-V data have been further analysed to estimate the produced photocurrent as a function of the applied bias (forward or reverse) under given illumination levels. Comparisons between the simulated curves and the experimental data allowed a detailed photocurrent modelling validation. The proposed approach could be useful towards studying other parameters of optically activated p-n junctions such as: the bias dependence of the minority carrier diffusion lengths and/or the generated rates of electron-hole pairs (EHP). Molecular Diversity Preservation International (MDPI) 2004-07-20 /pmc/articles/PMC3954071/ Text en © 2004 by MDPI (http://www.mdpi.org). Reproduction is permitted for noncommercial purposes. |
spellingShingle | Article Dervos, Constantine T. Skafidas, Panayotis D. Mergos, John A. Vassiliou, Panayota p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title | p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title_full | p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title_fullStr | p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title_full_unstemmed | p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title_short | p-n Junction Photocurrent Modelling Evaluation under Optical and Electrical Excitation |
title_sort | p-n junction photocurrent modelling evaluation under optical and electrical excitation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3954071/ |
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