Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers

Technology scaling relies on reduced nodal capacitances and lower voltages in order to improve performance and power consumption, resulting in significant increase in layout density, thus making these submicron technologies more susceptible to soft errors. Previous analysis indicates a significant i...

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Detalles Bibliográficos
Autores principales: Mahyuddin, Nor Muzlifah, Russell, Gordon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3977446/
https://www.ncbi.nlm.nih.gov/pubmed/24782671
http://dx.doi.org/10.1155/2014/876435

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3977446/
https://www.ncbi.nlm.nih.gov/pubmed/24782671
http://dx.doi.org/10.1155/2014/876435

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