Possibility of graphene growth by close space sublimation

Carbon films on the Si/SiO(2) substrate are fabricated using modified method of close space sublimation at atmospheric pressure. The film properties have been characterized by micro-Raman and X-ray photoelectron spectroscopy and monochromatic ellipsometry methods. Ellipsometrical measurements demons...

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Detalles Bibliográficos
Autores principales: Sopinskyy, Mykola V, Khomchenko, Viktoriya S, Strelchuk, Viktor V, Nikolenko, Andrii S, Olchovyk, Genadiy P, Vishnyak, Volodymyr V, Stonis, Viktor V
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3989852/
https://www.ncbi.nlm.nih.gov/pubmed/24731549
http://dx.doi.org/10.1186/1556-276X-9-182

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3989852/
https://www.ncbi.nlm.nih.gov/pubmed/24731549
http://dx.doi.org/10.1186/1556-276X-9-182

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