Cargando…
Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies
The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differ...
| Autores principales: | , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2014
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3999761/ https://www.ncbi.nlm.nih.gov/pubmed/24778949 http://dx.doi.org/10.3762/bjnano.5.30 |