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Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differ...

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Detalles Bibliográficos
Autores principales:	Stan, Gheorghe, Solares, Santiago D
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2014
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3999761/ https://www.ncbi.nlm.nih.gov/pubmed/24778949 http://dx.doi.org/10.3762/bjnano.5.30

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