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Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces
In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3999863/ https://www.ncbi.nlm.nih.gov/pubmed/24778964 http://dx.doi.org/10.3762/bjnano.5.45 |