Postbuckling Investigations of Piezoelectric Microdevices Considering Damage Effects

Piezoelectric material has been emerging as a popular building block in MEMS devices owing to its unique mechanical and electrical material properties. However, the reliability of MEMS devices under buckling deformation environments remains elusive and needs to be further explored. Based on the Talr...

Descripción completa

Detalles Bibliográficos
Autores principales: Sun, Zhigang, Wang, Xianqiao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4003972/
https://www.ncbi.nlm.nih.gov/pubmed/24618774
http://dx.doi.org/10.3390/s140304876

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4003972/
https://www.ncbi.nlm.nih.gov/pubmed/24618774
http://dx.doi.org/10.3390/s140304876

Ejemplares similares