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Postbuckling Investigations of Piezoelectric Microdevices Considering Damage Effects
Piezoelectric material has been emerging as a popular building block in MEMS devices owing to its unique mechanical and electrical material properties. However, the reliability of MEMS devices under buckling deformation environments remains elusive and needs to be further explored. Based on the Talr...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2014
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4003972/ https://www.ncbi.nlm.nih.gov/pubmed/24618774 http://dx.doi.org/10.3390/s140304876 |