Capability of insulator study by photoemission electron microscopy at SPring-8

The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established in an extremely simple way. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft X-rays, and Au films close to the area of interest allow the accu...

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Detalles Bibliográficos
Autores principales: Ohkochi, Takuo, Kotsugi, Masato, Yamada, Keisuke, Kawano, Kenji, Horiba, Koji, Kitajima, Fumio, Oura, Masaki, Shiraki, Susumu, Hitosugi, Taro, Oshima, Masaharu, Ono, Teruo, Kinoshita, Toyohiko, Muro, Takayuki, Watanabe, Yoshio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4032072/
https://www.ncbi.nlm.nih.gov/pubmed/23765305
http://dx.doi.org/10.1107/S0909049513012508

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4032072/
https://www.ncbi.nlm.nih.gov/pubmed/23765305
http://dx.doi.org/10.1107/S0909049513012508

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