Characterizing the Effects of Intermittent Faults on a Processor for Dependability Enhancement Strategy

As semiconductor technology scales into the nanometer regime, intermittent faults have become an increasing threat. This paper focuses on the effects of intermittent faults on NET versus REG on one hand and the implications for dependability strategy on the other. First, the vulnerability characteri...

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Detalles Bibliográficos
Autores principales: Wang, Chao(Saul), Fu, Zhong-Chuan, Chen, Hong-Song, Wang, Dong-Sheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4032691/
https://www.ncbi.nlm.nih.gov/pubmed/24892043
http://dx.doi.org/10.1155/2014/286084

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4032691/
https://www.ncbi.nlm.nih.gov/pubmed/24892043
http://dx.doi.org/10.1155/2014/286084

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