Abnormal coexistence of unipolar, bipolar, and threshold resistive switching in an Al/NiO/ITO structure

This paper reports an abnormal coexistence of different resistive switching behaviors including unipolar (URS), bipolar (BRS), and threshold switching (TRS) in an Al/NiO/indium tin oxide (ITO) structure fabricated by chemical solution deposition. The switching behaviors have been strongly dependent...

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Detalles Bibliográficos
Autores principales: Yuan, Xin-Cai, Tang, Jin-Long, Zeng, Hui-Zhong, Wei, Xian-Hua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4041631/
https://www.ncbi.nlm.nih.gov/pubmed/24940181
http://dx.doi.org/10.1186/1556-276X-9-268

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4041631/
https://www.ncbi.nlm.nih.gov/pubmed/24940181
http://dx.doi.org/10.1186/1556-276X-9-268

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