Controlling the Er content of porous silicon using the doping current intensity

The results of an investigation on the Er doping of porous silicon are presented. Electrochemical impedance spectroscopy, optical reflectivity, and spatially resolved energy dispersive spectroscopy (EDS) coupled to scanning electron microscopy measurements were used to investigate on the transient d...

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Detalles Bibliográficos
Autores principales: Mula, Guido, Loddo, Lucy, Pinna, Elisa, Tiddia, Maria V, Mascia, Michele, Palmas, Simonetta, Ruffilli, Roberta, Falqui, Andrea
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4090651/
https://www.ncbi.nlm.nih.gov/pubmed/25024691
http://dx.doi.org/10.1186/1556-276X-9-332

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4090651/
https://www.ncbi.nlm.nih.gov/pubmed/25024691
http://dx.doi.org/10.1186/1556-276X-9-332

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